• DocumentCode
    2755665
  • Title

    Scan Compression Implementation in Industrial Design - Case Study

  • Author

    Hsu, Dragon ; Press, Ron

  • Author_Institution
    Ralink Technol. Corp., Hsinchu, Taiwan
  • fYear
    2009
  • fDate
    23-26 Nov. 2009
  • Firstpage
    83
  • Lastpage
    84
  • Abstract
    Embedded scan test compression is used to enable high test quality and has become a standard practice on many designs. This paper describes power and timing experiences related to embedded compression technology. A commercial tool was used to implement EDT compression technology in three wireless designs. The case study and results demonstrate the effect of power reduction methods and timing closure considerations.
  • Keywords
    automatic test pattern generation; embedded systems; integrated circuit design; integrated circuit testing; ATPG; EDT compression; automatic test pattern generation; embedded deterministic test compression technology; embedded scan test compression; industrial design; power reduction methods; scan compression implementation; timing closure considerations; Testing; Timing; EDT; component; embedded compression; test power; timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2009. ATS '09.
  • Conference_Location
    Taichung
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-3864-8
  • Type

    conf

  • DOI
    10.1109/ATS.2009.89
  • Filename
    5359402
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2755665