Title :
Optimal multiple syndrome probabilistic diagnosis
Author :
Lee, S. ; Shin, K.G.
Author_Institution :
Dept. of Electr. Eng., Delaware Univ., Newark, DE, USA
Abstract :
The authors discuss the distributed self-diagnosis of a multiprocessor/multicomputer system based on interprocessor tests with imperfect fault coverage (thus also permitting intermittently fault processors). It is shown that by using multiple fault syndromes, it is possible to achieve significantly better diagnosis than by using a single fault syndrome, even when the amount of time devoted to testing is the same. The authors derive a multiple syndrome diagnosis algorithm that is optimal in the level of diagnostic accuracy achieved (among diagnosis algorithms of a certain type to be defined) and produces good results even with sparse interconnection networks and interprocessor test with low fault coverage. Furthermore, they prove upper and lower bounds are proved on the number of fault syndromes required to produce asymptotically a 100% correct diagnostic as N to infinity . Their solution and another multiple syndrome diagnosis solution by D. Fussell and S. Rangarajan are evaluated both analytically and with simulations.<>
Keywords :
fault tolerant computing; multiprocessing systems; diagnostic accuracy; distributed self-diagnosis; imperfect fault coverage; interprocessor test; interprocessor tests; lower bounds; multicomputer system; multiple fault syndromes; multiprocessor; optimal multiple syndrome probabilistic diagnosis; sparse interconnection networks; upper bounds; Algorithm design and analysis; Analytical models; Automatic testing; Fault diagnosis; H infinity control; Laboratories; Multiprocessing systems; Multiprocessor interconnection networks; System testing; Upper bound;
Conference_Titel :
Fault-Tolerant Computing, 1990. FTCS-20. Digest of Papers., 20th International Symposium
Conference_Location :
Newcastle Upon Tyne, UK
Print_ISBN :
0-8186-2051-X
DOI :
10.1109/FTCS.1990.89379