DocumentCode :
2755841
Title :
Best practice: An optimization of assets productivity in semiconductor manufacturing
Author :
Li, Yung-Ta
Author_Institution :
Dept. of Mech. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2010
fDate :
2-5 June 2010
Firstpage :
880
Lastpage :
884
Abstract :
ROE (Return on Equity) is something that causes the most concern by stockholders and is a major index when evaluating a company´s overall profitability. This paper introduces a new index-Equipment Asset Productivity (EAP) to aid index-Asset Productivity (AP), the key elements of ROE, by benchmarking Fab-by-Fab asset management performance over time. A hierarchical asset management mechanism was developed to identify the root causes of poor asset management performance. The aim is to provide attainable execution plan that will allow senior management to improve assets productivity. In addition, the paper also designates the ownership of each index required to monitor progress in the future then by raising ROE.
Keywords :
economic indicators; financial management; optimisation; productivity; profitability; semiconductor industry; EAP; ROE; asset management mechanism; assets productivity; equipment asset productivity; fab-by-fab asset management performance; optimization; profitability; return on equity; semiconductor manufacturing; stockholders; Application specific processors; Asset management; Best practices; Demand forecasting; Economic forecasting; Electric breakdown; Load forecasting; Monitoring; Productivity; Semiconductor device manufacture; Asset Management; Asset Productivity; Benchmark; Equipment Asset Productivity; Fab; Return on Equity (ROE);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Management of Innovation and Technology (ICMIT), 2010 IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-6565-1
Electronic_ISBN :
978-1-4244-6566-8
Type :
conf
DOI :
10.1109/ICMIT.2010.5492807
Filename :
5492807
Link To Document :
بازگشت