Title :
On Scan Chain Diagnosis for Intermittent Faults
Author :
Adolfsson, Dan ; Siew, Joanna ; Marinissen, Erik Jan ; Larsson, Erik
Author_Institution :
NXP Semicond. Corp. Innovation & Technol., Eindhoven, Netherlands
Abstract :
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Scan chain defects constitute a significant fraction of the overall digital defect universe, and hence it is well justified that scan chain diagnosis has received increasing research attention in recent years. In this paper, we address the problem of scan chain diagnosis for intermittent faults. We show that the conventional scan chain test pattern is likely to miss an intermittent fault, or inaccurately diagnose it. We propose an improved scan chain test pattern which we show to be effective. Subsequently, we demonstrate that the conventional bound calculation algorithm is likely to produce wrong results in the case of an intermittent fault. We propose a new lower bound calculation method which does generate correct and tight bounds, even for an intermittence probability as low as 10%.
Keywords :
failure analysis; integrated circuit testing; logic circuits; logic testing; bound calculation algorithm; failing ICs analysis; high-volume test response analysis; intermittence probability; intermittent faults; scan chain defects; scan chain diagnosis; scan chain test pattern; Computer science; Digital systems; Failure analysis; Fault diagnosis; Logic testing; Marine technology; Probability; Semiconductor device testing; System testing; Technological innovation; diagnosis; integrated circuit; intermittent fault; scan chain; test;
Conference_Titel :
Asian Test Symposium, 2009. ATS '09.
Conference_Location :
Taichung
Print_ISBN :
978-0-7695-3864-8
DOI :
10.1109/ATS.2009.74