Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns

Author

Huang, Yu ; Cheng, Wu-Tung ; Guo, Ruifeng ; Tai, Ting-Pu ; Kuo, Feng-Ming ; Chen, Yuan-Shih

Author_Institution

Mentor Graphics Corp., Wilsonville, OR, USA

fYear

2009

fDate

23-26 Nov. 2009

Firstpage

35

Lastpage

40

Abstract

In the past, software based scan chain defect diagnosis can be roughly classified into two categories (1) model-based algorithms, and (2) data-driven algorithms. In this paper we first analyze the advantages and disadvantages of each category of the chain diagnosis algorithms. Next, an adaptive signal profiling algorithm that can use manufacturing ATPG scan patterns is proposed for scan chain diagnosis. Finally, several case studies and their PFA results are presented to validate the accuracy and effectiveness of the proposed algorithm.

Keywords

automatic test pattern generation; failure analysis; integrated circuit testing; ATPG scan patterns; adaptive signal profiling algorithm; data-driven algorithms; model-based algorithms; physical failure analysis; scan chain diagnosis; scan-based testing; software based scan chain defect diagnosis; Automatic test pattern generation; Circuit testing; Clocks; Failure analysis; Fault diagnosis; Logic testing; Manufacturing; Semiconductor device manufacture; Software algorithms; System testing; adaptive system; chain diagnosis; physical failure analysis; signal profiling;

fLanguage

English

Publisher

ieee

Conference_Titel

Asian Test Symposium, 2009. ATS '09.

Conference_Location

Taichung

ISSN

1081-7735

Print_ISBN

978-0-7695-3864-8

Type

conf

DOI

10.1109/ATS.2009.36

Filename

5359419