DocumentCode :
2756116
Title :
Design of microprocessors with built-in on-line test
Author :
Leveugle, R. ; Michel, T. ; Saucier, G.
Author_Institution :
Inst. Nat. Polytech. de Grenoble/CSI, France
fYear :
1990
fDate :
26-28 June 1990
Firstpage :
450
Lastpage :
456
Abstract :
Control flow checking techniques are discussed. Invariant properties of the control flow can be checked at two different levels: verification of the sequencing in the controller of the microprocessor or verification of the control flow in the application program. Control flow checking has been implemented, at the two levels, in different versions of a 32-b microprocessor designed in a CMOS 1.5- mu technology. Integration of the monitors on silicon is detailed. The silicon overhead due to the different online test devices is precisely discussed. Different versions of this microprocessor have been designed and implemented in order to make real cost comparisons on components with identical functionality but different integrated monitors. Here only the hardware cost of concurrent checking is considered.<>
Keywords :
CMOS integrated circuits; built-in self test; microprocessor chips; 1.5 micron; 32 bit; CMOS; application program; built-in on-line test; control flow checking; microprocessors; sequencing; silicon; verification; CMOS technology; Compaction; Controllability; Costs; Hardware; Microprocessors; Monitoring; Observability; Read only memory; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fault-Tolerant Computing, 1990. FTCS-20. Digest of Papers., 20th International Symposium
Conference_Location :
Newcastle Upon Tyne, UK
Print_ISBN :
0-8186-2051-X
Type :
conf
DOI :
10.1109/FTCS.1990.89381
Filename :
89381
Link To Document :
بازگشت