• DocumentCode
    2756344
  • Title

    Combinational equivalence checking using satisfiability and recursive learning

  • Author

    Marques-Silva, João ; Glass, Thomas

  • Author_Institution
    Cadence Eur. Labs., Inst. Superior Tecnico, Lisbon, Portugal
  • fYear
    1999
  • fDate
    9-12 March 1999
  • Firstpage
    145
  • Lastpage
    149
  • Abstract
    The problem of checking the equivalence of combinational circuits is of key significance in the verification of digital circuits. Previously, several approaches have been proposed for solving this problem. Still, the hardness of the problem and the ever-growing complexity of logic circuits motivates studying and developing alternative solutions. In this paper we study the application of Boolean satisfiability (SAT) algorithms for solving the combinational equivalence checking (CEC) problem. Although existing SAT algorithms are in general ineffective for solving CEC, in this paper we show how to improve SAT algorithms by extending and applying recursive learning techniques to the analysis of instances of SAT. This in turn provides a new alternative and competitive approach for solving CEC. Preliminary experimental results indicate that the proposed improved SAT algorithm can be useful for a large variety of instances of CEC, in particular when compared with pure BDD-based approaches.
  • Keywords
    circuit complexity; combinational circuits; computability; learning (artificial intelligence); recursive functions; Boolean satisfiability algorithms; SAT algorithm; combinational circuits; combinational equivalence checking; complexity; digital circuits; logic circuits; recursive learning; verification; Automatic testing; Boolean functions; Circuit testing; Combinational circuits; Delay; Electronic design automation and methodology; Electronic equipment testing; Electronics packaging; Glass; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
  • Conference_Location
    Munich, Germany
  • Print_ISBN
    0-7695-0078-1
  • Type

    conf

  • DOI
    10.1109/DATE.1999.761110
  • Filename
    761110