• DocumentCode
    2756368
  • Title

    Logic transformation for low power synthesis

  • Author

    Kim, Ki-Wook ; Ting Ting Hwang ; Liu, C.L. ; Kang, Sung-Mo

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    158
  • Lastpage
    162
  • Abstract
    In this paper we present a new approach to the problem of local logic transformation for reduction of power dissipation in logic circuits. Based on the finite-state input transition (FIT) power dissipation model, we introduce a cost function which accounts for the effects of input capacitance, input slew rate, internal parasitic capacitance of logic gates, interconnect capacitance, as well as switching power. Our approach provides an efficient way of estimating estimating the global effect of local logic transformations in logic circuits. In our approach, the FIT model for the transitive fanout cells of a locally transformed subcircuit can be reused to measure the global power dissipation by varying the input probabilities of the transitive fanout cells. Local logic transformation is carried our based on compatible sets of permissible functions (CSPF). Experimental results show that local logic transformation based on CSPF using our cost function can reduce power consumption by about 36% on average without increase in the worst-case circuit delay
  • Keywords
    CMOS logic circuits; combinational circuits; integrated circuit design; logic design; logic partitioning; FIT model; compatible sets of permissible functions; cost function; finite-state input transition power dissipation model; global effect; input capacitance; input probabilities; input slew rate; interconnect capacitance; internal parasitic capacitance; local logic transformations; locally transformed subcircuit; logic circuits; logic gates; logic transformation; low power synthesis; power dissipation; switching power; transitive fanout cells; Circuit synthesis; Cost function; Delay; Energy consumption; Integrated circuit interconnections; Logic circuits; Logic gates; Parasitic capacitance; Power dissipation; Power measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
  • Conference_Location
    Munich
  • Print_ISBN
    0-7695-0078-1
  • Type

    conf

  • DOI
    10.1109/DATE.1999.761112
  • Filename
    761112