DocumentCode :
2756368
Title :
Logic transformation for low power synthesis
Author :
Kim, Ki-Wook ; Ting Ting Hwang ; Liu, C.L. ; Kang, Sung-Mo
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear :
1999
fDate :
1999
Firstpage :
158
Lastpage :
162
Abstract :
In this paper we present a new approach to the problem of local logic transformation for reduction of power dissipation in logic circuits. Based on the finite-state input transition (FIT) power dissipation model, we introduce a cost function which accounts for the effects of input capacitance, input slew rate, internal parasitic capacitance of logic gates, interconnect capacitance, as well as switching power. Our approach provides an efficient way of estimating estimating the global effect of local logic transformations in logic circuits. In our approach, the FIT model for the transitive fanout cells of a locally transformed subcircuit can be reused to measure the global power dissipation by varying the input probabilities of the transitive fanout cells. Local logic transformation is carried our based on compatible sets of permissible functions (CSPF). Experimental results show that local logic transformation based on CSPF using our cost function can reduce power consumption by about 36% on average without increase in the worst-case circuit delay
Keywords :
CMOS logic circuits; combinational circuits; integrated circuit design; logic design; logic partitioning; FIT model; compatible sets of permissible functions; cost function; finite-state input transition power dissipation model; global effect; input capacitance; input probabilities; input slew rate; interconnect capacitance; internal parasitic capacitance; local logic transformations; locally transformed subcircuit; logic circuits; logic gates; logic transformation; low power synthesis; power dissipation; switching power; transitive fanout cells; Circuit synthesis; Cost function; Delay; Energy consumption; Integrated circuit interconnections; Logic circuits; Logic gates; Parasitic capacitance; Power dissipation; Power measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
Conference_Location :
Munich
Print_ISBN :
0-7695-0078-1
Type :
conf
DOI :
10.1109/DATE.1999.761112
Filename :
761112
Link To Document :
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