DocumentCode :
2757002
Title :
Performance evaluation of multiple-valued logic circuits using statistical approach
Author :
Teng, Daniel H Y ; Bolton, Ronald J.
Author_Institution :
Dept. of Electr. Eng., Saskatchewan Univ., Saskatoon, Sask.
fYear :
2005
fDate :
1-4 May 2005
Firstpage :
300
Lastpage :
303
Abstract :
Since there are no standard benchmark functions available for comparing multiple-valued logic (MVL) designs, benchmark functions for binary logic design are often used for performance analysis of MVL circuits. An alternative would be to test all the possible multiple-valued logic functions for different input variables. Considering the fact that for r-valued logic, there are rr2 possible 2-input functions, testing of all functions is too much time consuming. Therefore, a choice has to be made between random functions and benchmark functions. This paper presents a statistical approach for fast comparison of MVL designs. The result shows that 150 random functions are sufficient to obtain an average circuit size of 2-input, 4-valued logic functions
Keywords :
CMOS logic circuits; network synthesis; random functions; statistical analysis; 2-input functions; 4-valued logic functions; benchmark functions; binary logic design; multiple-valued logic circuits; random functions; statistical approach; Benchmark testing; CMOS logic circuits; Circuit testing; Computer architecture; Input variables; Logic circuits; Logic design; Logic functions; Logic testing; Synthesizers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering, 2005. Canadian Conference on
Conference_Location :
Saskatoon, Sask.
ISSN :
0840-7789
Print_ISBN :
0-7803-8885-2
Type :
conf
DOI :
10.1109/CCECE.2005.1556932
Filename :
1556932
Link To Document :
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