• DocumentCode
    2757143
  • Title

    Three-dimensional Machine Vision Using Gated Imaging System: A Numerical Analysis

  • Author

    Tan, ChingSeong ; Sluzek, Andrzej ; Seet, Gerald ; Shacklock, Andrew

  • Author_Institution
    Precision Measurements, Singapore Inst. of Manuf. Technol.
  • fYear
    2006
  • fDate
    Dec. 2006
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Various researchers have suggested techniques in gated imaging and "smart" pixels technologies that achieve simultaneous depth mapping and optical imaging with enhanced depth detection accuracy and resolutions range from a few cm to less than 1 mm. In this paper, we demonstrate how depth accuracy and resolution can be studied more systematically (and depending on the range detection technique). We propose that the depth detection and resolution study should be treated as two separate configurations. In particular, we recommend statistical approach for camera gating shorter than (or equal to) target irradiance and quantitative approach for gating time longer than target irradiance. A very accurate method by J. Busck is analyzed as an example of the statistical approach. The results indicate that the depth accuracy is less affected by the reflected Gaussian noise for longer range targets. The numerical analysis shows that it is necessary to introduce a correction based on the gating and target irradiance profiles to achieve accurate depth detection. An objective quantitative evaluation method is also discussed. It is suggested to replace the existing subjective measure in determining the depth resolution by the proposed approach. Supporting data for this approach will be presented in future works
  • Keywords
    Gaussian noise; computer vision; image resolution; numerical analysis; statistical analysis; 3D imaging; Gaussian noise; camera gating; depth detection; depth mapping; gated imaging system; machine vision; numerical analysis; objective quantitative evaluation; optical imaging; resolution; smart pixels technology; statistical approach; target irradiance profile; Cameras; Computer aided manufacturing; High-resolution imaging; Image resolution; Machine vision; Numerical analysis; Optical imaging; Optical pulses; Quantum well lasers; Smart pixels; 3D imaging; depth mapping; gated imaging; machine vision;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics, Automation and Mechatronics, 2006 IEEE Conference on
  • Conference_Location
    Bangkok
  • Print_ISBN
    1-4244-0024-4
  • Electronic_ISBN
    1-4244-0025-2
  • Type

    conf

  • DOI
    10.1109/RAMECH.2006.252696
  • Filename
    4018812