Title :
Functional verification methodology for microprocessors using the Genesys test-program generator. Application to the x86 microprocessors family
Author :
Fournier, Laurent ; Arbetman, Yaron ; Levinger, Moshe
Author_Institution :
Res. Lab., IBM Israel Sci. & Technol. Center, Haifa, Israel
Abstract :
Even though the importance of microprocessor design verification is widely acknowledged, no rigorous methodology is being commonly followed for its realization. This paper attempts to delineate such a methodology, and shows how it is promoted by Genesys, an automatic pseudo-random test-program generator. The methodology relies on a verification plan which induces smart sets of tests that carry out the verification tasks. The paper reports on an application of this methodology, using Genesys, to verify an x86 design and describes, in particular, how this methodology could have helped to avoid known escape bugs, such as the recent two infamous Pentium Floating Point bugs
Keywords :
circuit CAD; formal verification; integrated circuit design; integrated circuit testing; microprocessor chips; Genesys automatic pseudo-random test program generator; Pentium floating point bug; functional verification; x86 microprocessor design; Computer bugs; Feedback; Frequency; Libraries; Microprocessors; Testing;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
Conference_Location :
Munich
Print_ISBN :
0-7695-0078-1
DOI :
10.1109/DATE.1999.761162