Title :
Symbolic functional vector generation for VHDL specifications
Author :
Ferrandi, Fabrizio ; Fummi, Franco ; Gerli, Luca ; Sciuto, Donatella
Author_Institution :
Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
Abstract :
Verification of the functional correctness of VHDL specifications is one of the primary and most time consuming tasks of design. However, it must necessarily be an incomplete task since it is impossible to completely exercise the specification by exhaustively applying all input patterns. The paper aims at presenting a two-step strategy based on symbolic analysis of the VHDL specification, using a behavioral fault model. First, we generate a reduced number of functional test vectors for each process of the specification which allows complete code statement coverage and bit coverage, allowing the identification of possible redundancies in the VHDL process. Then, through the definition of a controllability measure, we verify if these functional test vectors can be applied to the process inputs when interconnected to other processes. If this is not the case, the analysis of the nonapplicable inputs provides identification of possible code redundancies and design errors. Experimental results show that bit coverage provides complete statement coverage and a more detailed identification of possible design errors.
Keywords :
fault diagnosis; hardware description languages; logic testing; redundancy; symbol manipulation; VHDL specifications; behavioral fault model; bit coverage; code statement coverage; controllability measure; design errors; functional correctness; nonapplicable inputs; process inputs; redundancies; symbolic analysis; symbolic functional vector generation; two-step strategy; Algorithm design and analysis; Controllability; High level synthesis; Pattern analysis; Performance analysis; Performance evaluation; Redundancy; Software engineering; Test pattern generators; Testing;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
Conference_Location :
Munich, Germany
Print_ISBN :
0-7695-0078-1
DOI :
10.1109/DATE.1999.761163