Title :
Volmetric pattern prediction of antennas on aircrafts
Author_Institution :
Institut für Hochfrequenztechnik, Oberpfaffenhofen, Germany
Keywords :
Aircraft manufacture; Chromium; Electromagnetic fields; Ellipsoids; Frequency; Mathematical model; Pattern analysis; Physical theory of diffraction; Position measurement; Ray tracing;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1979
DOI :
10.1109/APS.1979.1148114
