DocumentCode :
2757344
Title :
System Level Hardening by Computing with Matrices
Author :
Ferreira, Ronaldo R. ; Moreira, Álvaro F. ; Carro, Luigi
Author_Institution :
Inst. de Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
fYear :
2010
fDate :
1-3 Sept. 2010
Firstpage :
373
Lastpage :
379
Abstract :
Continuous advances in transistor manufacturing have enabled technology scaling along the years, sustaining Moore´s law. As transistors sizes rapidly shrink, and voltage scales, the amount of charge in a node also rapidly decreases. A particle hitting the core will probably cause a transient fault to spam over several clock cycles. In this scenario, embedded systems using state-of-the-art technologies will face the challenge of operating in an environment susceptible to multiple errors, but with restricted resources available to deploy fault-tolerance, as these techniques severely increase power consumption. One possible solution to this problem is the adoption of software based fault-tolerance at the system level, aiming at reduced energy levels to ensure reliability and low energy dissipation. In this paper, we claim the detection and correction of errors on generic data structures at system level by using matrices to encode any program and algorithm. With such encoding, it is possible to employ established techniques of detection and correction of errors occurring in matrices, running with inexpressive overhead of power and energy. We evaluated this proposal using two case studies significant for the embedded system domain. Using the proposed approach, we observed in some cases an overhead of only 5% in performance and 8% in program size.
Keywords :
data structures; embedded systems; matrix algebra; software fault tolerance; Moore´s law; embedded systems; fault tolerance; generic data structures; low energy dissipation; matrices; power consumption; software based fault-tolerance; system level hardening; technology scaling; transient fault; transistor manufacturing; Equations; Fault tolerance; Fault tolerant systems; Fingerprint recognition; Heuristic algorithms; Software; Transient analysis; embedded systems; fault-tolerance; fingerprinting; hardening; matrix analysis; transient faults;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design: Architectures, Methods and Tools (DSD), 2010 13th Euromicro Conference on
Conference_Location :
Lille
Print_ISBN :
978-1-4244-7839-2
Type :
conf
DOI :
10.1109/DSD.2010.8
Filename :
5615587
Link To Document :
بازگشت