Title :
Improving the reverse blocking capability of carrier stored trench-gate bipolar transistor
Author :
Tan, C.M. ; Wong, Y.F. ; Teoh, P.H. ; Huang, G.Y.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Abstract :
Recently, a new IGBT structure, carrier stored trench gate bipolar transistor (CSTBT) was introduced. This structure, modified from the Trench IGBT, preserves the good characteristics of trench IGBT, and also improves the trade off characteristic between the on-state voltage drop and switching loss. However, its reverse blocking voltage is only around 10 V. The low reverse blocking capability of the CSTBT could limit its application in power electronic circuits. To increase the reverse blocking voltage, a p-layer is added in between the P+-N+ junction. Simulation shows that the additional p-layer has no effect to the forward characteristic and the turn-on speed of the IGBT, except to increase the reverse blocking voltage to above 80 V.
Keywords :
insulated gate bipolar transistors; power bipolar transistors; 10 V; IGBT structure; breakdown voltage; carrier stored trench gate bipolar transistor; insulated gate bipolar transistor; on-state voltage drop; p-layer insertion; power electronic circuits; reverse blocking capability; switching loss; Bipolar transistors; Breakdown voltage; Circuit simulation; Doping; Insulated gate bipolar transistors; Low voltage; MOSFET circuits; Medical simulation; Power electronics; Switching loss;
Conference_Titel :
Power Electronics and Drive Systems, 2003. PEDS 2003. The Fifth International Conference on
Print_ISBN :
0-7803-7885-7
DOI :
10.1109/PEDS.2003.1282685