Title :
Exploring the combination of IDDQ and iDDt testing: energy testing
Author :
Rius, Josep ; Figueras, Joan
Author_Institution :
Dept. d´´Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
Abstract :
The feasibility of combining IDDQ and and iDDt testing to detect defective CMOS circuits by measuring the energy consumed by the tested circuit is considered. The energy chronogram of a circuit is used as an energy signature which makes it possible to distinguish between defect-free and defective circuits. Exploratory implementation of the proposed method is presented and experimental results obtained from in-house full custom circuits and commercially available circuits are discussed
Keywords :
CMOS digital integrated circuits; automatic testing; integrated circuit testing; CMOS circuits; IDDQ testing; defect-free circuits; defective circuit detection; energy chronogram; energy signature; energy testing; iDDt testing; Testing;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
Conference_Location :
Munich
Print_ISBN :
0-7695-0078-1
DOI :
10.1109/DATE.1999.761180
