DocumentCode :
2757716
Title :
Event Query Processing in EPC Information Services
Author :
Nguyen, Tuyen ; Lee, Young-Koo ; Jeong, Byeong-Soo ; Lee, Sungyoung
Author_Institution :
Dept. of Electron. & Inf., KyungHee Univ., Seoul
fYear :
2007
fDate :
16-18 Dec. 2007
Firstpage :
159
Lastpage :
166
Abstract :
Radio frequency identification (RFID) technology is an excellent substitute for barcodes in industry. However, the management of a large amount of RFID data, together with complicated relationships between data, in the context of responding to different kinds of queries is not well supported by traditional databases. Therefore, (1) an event-based model for managing data and (2) an algorithm for responding to event queries are proposed for RFID repositories in this paper. Our approach is based on the specification of the EPC information services (EPCIS) to meet the overall data requirements of the RFID community. Specifically, the object-oriented model is built on the top of relational databases so as to make the proposed combined data model highly flexible and semantic comprehensive. Based on this data model, various complicated predicates implied in different parameters of the predefined event query are interpreted into one single request to the database.
Keywords :
bar codes; data models; object-oriented databases; query processing; radiofrequency identification; relational databases; EPC information service; RFID data management; RFID repository; RFID technology; barcode; data model; data requirement; electronic product code; event query processing; event-based model; object-oriented model; radio frequency identification; relational database; Data models; Industrial relations; Object oriented databases; Object oriented modeling; Query processing; Radiofrequency identification; Relational databases; Signal processing; Standards development; Web and internet services;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal-Image Technologies and Internet-Based System, 2007. SITIS '07. Third International IEEE Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3122-9
Type :
conf
DOI :
10.1109/SITIS.2007.50
Filename :
4618772
Link To Document :
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