DocumentCode
2757966
Title
Coupled noise estimation for distributed RC interconnect model
Author
Wang, Janet M. ; Yu, Qingjian ; Kuh, Ernest S.
Author_Institution
California Univ., Berkeley, CA, USA
fYear
1999
fDate
9-12 March 1999
Firstpage
664
Lastpage
668
Abstract
With the increase in signal speed and the development of process technology, distributed RC line model is found to be more suitable for on-chip interconnects than lumped RC model, especially for interconnects around and below 0.25 /spl mu/m. In this paper, we first describe a new explicit form for crosstalk approximation for coupled RC lines. Then we introduce a novel passive model order reduction technique for distributed RC lines. These two parts serve as two steps in static noise analysis of full on-chip interconnect networks called pruning process and static analysis process.
Keywords
crosstalk; distributed parameter networks; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; transient analysis; wiring; 0.25 micron; coupled RC lines; coupled noise estimation; crosstalk approximation; distributed RC interconnect model; on-chip interconnects; passive model order reduction technique; process technology; pruning process; signal speed; static analysis process; static noise analysis; Capacitance; Computational efficiency; Crosstalk; Network-on-a-chip; Noise reduction; Reduced order systems; Signal processing; Transient analysis; Voltage; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
Conference_Location
Munich, Germany
Print_ISBN
0-7695-0078-1
Type
conf
DOI
10.1109/DATE.1999.761200
Filename
761200
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