• DocumentCode
    2758058
  • Title

    The effect of water ingress on dielectric properties of polyethylene cable insulation

  • Author

    Bernier, S. ; Drapeau, J.-F. ; Jean, D. ; David, É

  • Author_Institution
    Unite Expertise Equipement Electr., Inst. de Rech. d´´Hydro-Quebec (IREQ), Varennes, QC, Canada
  • fYear
    2012
  • fDate
    10-13 June 2012
  • Firstpage
    270
  • Lastpage
    276
  • Abstract
    This paper reports on dielectric loss diagnostic features (absolute values, voltage dependence, etc.) measurements and results of residual breakdown voltages obtained on miniature (RG-58) cables as a function of water absorption and electrical aging by water trees (WT) under a 5 kV/mm voltage stress (AC). The dielectric losses were measured at voltages up to 5 kV (i) in polarization and depolarization using Time Domain Spectroscopy (TDS) and (ii) with a classical very low frequency (VLF) system using a 0.1 Hz sine wave. The corresponding residual AC breakdown voltages were analyzed using the standard procedure. After ~3000 h of water and voltage exposure, aged cable samples showed a relatively low level of degradation, mainly bow tie water trees, with longest being ~19% of insulation thickness. TDS and VLF dielectric loss results show that for such an aging condition, the dielectric response is mainly dominated by the presence of water in the insulation.
  • Keywords
    absorption; dielectric losses; polyethylene insulation; power cable insulation; trees (electrical); RG-58 cables; TDS; VLF dielectric loss system; dielectric loss diagnostic measurement; dielectric properties; electrical aging; frequency 0.1 Hz; insulation thickness; polyethylene cable insulation; residual AC breakdown voltages; time domain spectroscopy; very low frequency system; voltage stress; water absorption; water ingress effect; water trees; Aging; Cable insulation; Dielectric loss measurement; Dielectric losses; Power cables; Cables; Diagnostics; Dielectric losses; TDS; VLF; Water trees; Weibull;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation (ISEI), Conference Record of the 2012 IEEE International Symposium on
  • Conference_Location
    San Juan, PR
  • ISSN
    1089-084X
  • Print_ISBN
    978-1-4673-0488-7
  • Electronic_ISBN
    1089-084X
  • Type

    conf

  • DOI
    10.1109/ELINSL.2012.6251471
  • Filename
    6251471