DocumentCode
2758058
Title
The effect of water ingress on dielectric properties of polyethylene cable insulation
Author
Bernier, S. ; Drapeau, J.-F. ; Jean, D. ; David, É
Author_Institution
Unite Expertise Equipement Electr., Inst. de Rech. d´´Hydro-Quebec (IREQ), Varennes, QC, Canada
fYear
2012
fDate
10-13 June 2012
Firstpage
270
Lastpage
276
Abstract
This paper reports on dielectric loss diagnostic features (absolute values, voltage dependence, etc.) measurements and results of residual breakdown voltages obtained on miniature (RG-58) cables as a function of water absorption and electrical aging by water trees (WT) under a 5 kV/mm voltage stress (AC). The dielectric losses were measured at voltages up to 5 kV (i) in polarization and depolarization using Time Domain Spectroscopy (TDS) and (ii) with a classical very low frequency (VLF) system using a 0.1 Hz sine wave. The corresponding residual AC breakdown voltages were analyzed using the standard procedure. After ~3000 h of water and voltage exposure, aged cable samples showed a relatively low level of degradation, mainly bow tie water trees, with longest being ~19% of insulation thickness. TDS and VLF dielectric loss results show that for such an aging condition, the dielectric response is mainly dominated by the presence of water in the insulation.
Keywords
absorption; dielectric losses; polyethylene insulation; power cable insulation; trees (electrical); RG-58 cables; TDS; VLF dielectric loss system; dielectric loss diagnostic measurement; dielectric properties; electrical aging; frequency 0.1 Hz; insulation thickness; polyethylene cable insulation; residual AC breakdown voltages; time domain spectroscopy; very low frequency system; voltage stress; water absorption; water ingress effect; water trees; Aging; Cable insulation; Dielectric loss measurement; Dielectric losses; Power cables; Cables; Diagnostics; Dielectric losses; TDS; VLF; Water trees; Weibull;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation (ISEI), Conference Record of the 2012 IEEE International Symposium on
Conference_Location
San Juan, PR
ISSN
1089-084X
Print_ISBN
978-1-4673-0488-7
Electronic_ISBN
1089-084X
Type
conf
DOI
10.1109/ELINSL.2012.6251471
Filename
6251471
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