Title :
Facet reflectivity of antireflection-coated electroabsorption waveguide measured from photocurrent
Author :
Kang, Byung-Kwon ; Park, Yoon Ho ; Seek Lee ; Kim, Sun Ho ; Choi, Sang Sam ; Lee, Seok ; Kamiya, Takeshi ; Park, Seung-Han
Author_Institution :
Photonics Res. Center, Korea Inst. of Sci. & Technol., Seoul, South Korea
Abstract :
Proposes a method to measure the low reflectivity of AR-coated EA waveguide facets by using the photocurrent. The Fabry-Perot interference effect is introduced in our method and the overall propagation loss and the facet reflectivity of EA waveguides are investigated from the photocurrent and reflectance on the front facet of the waveguide in the wavelength range from 1.54 μm to 1.57 μm. InGaAsP/InGaAsP multiple-quantum-well (MQW) EA waveguides were fabricated and cleaved with various cavity lengths. The propagation losses and cleaved facet reflectivity are determined from the contrast ratio in the photocurrent and reflectance spectra of the cleaved waveguide
Keywords :
III-V semiconductors; antireflection coatings; electro-optical modulation; electroabsorption; gallium arsenide; gallium compounds; indium compounds; optical fabrication; optical losses; optical waveguide components; photoelectron spectra; photoemission; quantum well devices; reflectivity; semiconductor quantum wells; 1.54 to 1.57 mum; Fabry-Perot interference effect; InGaAsP-InGaAsP; InGaAsP/InGaAsP; InGaAsP/InGaAsP multiple-quantum-well electroabsorption waveguides; antireflection-coated electroabsorption waveguide; antireflection-coated electroabsorption waveguide facets; cavity lengths; cleavage; cleaved facet reflectivity; cleaved waveguide; contrast ratio; electroabsorption waveguides; fabrication; facet reflectivity; front facet; low reflectivity; photocurrent; propagation loss; propagation losses; reflectance; reflectance spectra; waveguide; wavelength range; Coatings; Loss measurement; Optical waveguides; Photoconductivity; Propagation losses; Reflectivity; Semiconductor waveguides; Stimulated emission; Sun; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location :
Rio Grande
Print_ISBN :
0-7803-5947-X
DOI :
10.1109/LEOS.2000.893933
