Title :
ADOLT-An ADaptable On-Line Testing scheme for VLSI circuits
Author :
Maamar, A. ; Russell, G.
Author_Institution :
Dept. of Electr. & Electron. Eng., Newcastle upon Tyne Univ., UK
Abstract :
ADOLT permits the error detection capabilities of a CED scheme to be adapted to the error detection requirements of an application. This reduces the impact of the scheme on the design in terms of area overheads and the effect on performance. The scheme uses a slightly modified version of Dong´s code [1982] and gives a more efficient implementation than previous methods.
Keywords :
VLSI; automatic testing; design for testability; error detection; integrated circuit testing; ADOLT; CED scheme; Dong´s code; VLSI circuits; adaptable on-line testing scheme; area overheads; error detection capabilities; Circuit testing; Decision support systems; Very large scale integration;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
Conference_Location :
Munich, Germany
Print_ISBN :
0-7695-0078-1
DOI :
10.1109/DATE.1999.761223
