Secondary strips sources for EM diffraction-near field mapping and RCS

Analysis of EM scattering from perfectly conducting objects is achieved by a simple rigorous method to obtain both near field and far field with accuracy. The geometry of the object is modeled by breaking down the contour into a series of canonical strips where singularities due to the edges are eliminated in the solution of the integral equation (E type). The near field is plotted from the average complex Poynting vector, and the far field is calculated to obtain the RCS. Then, the wavefront dislocation is used to analyse the physical phenomenon through the active and reactive energy around the object in order to apprehend the final RCS observations