• DocumentCode
    2758499
  • Title

    Joint Compression and Classification for Textures in the Wavelet and Ridgelet Domain

  • Author

    Joshi, M.S. ; Manthalkar, R.R. ; Joshi, Y.V.

  • Author_Institution
    Comput. Eng. Dept., Gov. Coll. of Eng., Aurangabad
  • fYear
    2007
  • fDate
    16-18 Dec. 2007
  • Firstpage
    563
  • Lastpage
    569
  • Abstract
    Image Compression is a widely addressed research area. Many compression standards are in place. There are many methods for image classification. But the joint compression and classification is a new research area wherein the classification is attempted in the compressed domain. The joint compression and classification (JCC) is explored in wavelet domain by some researchers. But it is not yet explored in Ridgelet domain. This paper discusses the performance of JCC for Wavelet and Ridgelet domain for Texture images. The experimentation is done with objective analysis and subjective analysis. Objective analysis is performed using the Compression metrics-RMSE, PSNR and classification metric- CCR. Subjective analysis is performed using Human Visual Perception. It is found that the Ridgelet Transform gives less Mean Squared Error (MSE) and is better for Joint Compression and Classification of Texture images. Extensive experimentation has been carried out to arrive at the conclusion.
  • Keywords
    image classification; image coding; image texture; mean square error methods; wavelet transforms; Ridgelet domain; image texture classification; image texture compression; mean squared error method; wavelet domain; Continuous wavelet transforms; Discrete wavelet transforms; Humans; Image coding; Internet; Performance analysis; Power engineering and energy; Visual perception; Wavelet domain; Wavelet transforms; Human Visual Perception; Joint compression and classification; Ridgelet Transform; Textures; Wavelet Transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal-Image Technologies and Internet-Based System, 2007. SITIS '07. Third International IEEE Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3122-9
  • Type

    conf

  • DOI
    10.1109/SITIS.2007.57
  • Filename
    4618823