Title :
Ultra Fast Grey Scale Face Detection Using Vector SIMD Programming
Author :
Vermeulen, O. ; Manzanera, A. ; Lacassagne, L.
Author_Institution :
UEI, ENSTA, Paris
Abstract :
This paper presents an ultra-fast detection algorithm for locating faces in grey scale videos. We first use motion detection to reduce the working area and find the approximate position of the head. Then a morphology-based technique is applied in this area to detect eye-analogue and lips-analogue regions. Next, the resulting components are used to search for potential facial features. Finally we select from the candidate triplets, the one that best represents a real face, calculating a fitness which takes into account things such as the symmetry and the proximity with the extrapolated position of the face. In order to achieve the maximal speed-up, we use the vector parallelism provided by the SIMD (simple instruction multiple data) extensions, available on most mainstream processors. The final program runs 65 times faster than the real-time. Experiments demonstrate that the success rate for single face videos reaches 85% in good conditions and can go down to 60% in harder cases. This approach can be useful in many applications, where the detection rate is not as important as the computation time, such as video face identification, or human-computer visual interfaces.
Keywords :
feature extraction; image motion analysis; object detection; parallel programming; eye-analogue region; facial features; grey scale videos; lips-analogue region; morphology-based technique; motion detection; simple instruction multiple data; ultra fast grey scale face detection; vector SIMD programming; vector parallelism; Face detection; Facial features; Head; Image edge detection; Internet; Lighting; Motion detection; Parallel processing; Registers; Videos; SIMD; face detection; real-time image processing; vector parallel programming;
Conference_Titel :
Signal-Image Technologies and Internet-Based System, 2007. SITIS '07. Third International IEEE Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3122-9
DOI :
10.1109/SITIS.2007.142