• DocumentCode
    2758558
  • Title

    Electrically induced pressure under switching operation and mechanical tensile strength as a new measurement tool of cable aging

  • Author

    El Zein, A.

  • Author_Institution
    Fac. of Eng., Zagazig Univ.
  • Volume
    1
  • fYear
    1996
  • fDate
    16-19 Jun 1996
  • Firstpage
    155
  • Abstract
    The study at aging has been carried out by many authors. Most of these studies relate the formed tree length with new branch with time. Also some of these studies relate applied voltage with breakdown voltage with time. In the present paper the author aimed the tree initiation as a pressure dependent mechanism. The tree starts at a defect point of protrusion tip. The electric field at these defect sites may reach very high values. The square value for the ratio of intrinsic electric stress of given dielectric medium to the operating applied electric field intensity at switching level value represent a main part of determining the age of a cable. Also the thickness of insulating material and the length of each step determines another part of cable age, especially for thicknesses larger than 1.12 mm
  • Keywords
    ageing; electric fields; insulation testing; life testing; mechanical variables measurement; power cable insulation; power cable testing; switching; tensile strength; tensile testing; trees (electrical); applied voltage; breakdown voltage; cable aging; dielectric medium; electric field; electrically induced pressure; formed tree length; insulating material thickness; intrinsic electric stress; measurement tool; mechanical tensile strength; protrusion tip; switching level; switching operation; tree initiation; Aging; Breakdown voltage; Conductors; Dielectric breakdown; Dielectric materials; Electric breakdown; Needles; Permittivity; Solids; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-3531-7
  • Type

    conf

  • DOI
    10.1109/ELINSL.1996.549306
  • Filename
    549306