• DocumentCode
    2759087
  • Title

    Behaviour Pattern-Based Model Generation for Model-Based Testing

  • Author

    Kanstren, Teemu

  • Author_Institution
    VTT Tech. Res. Centre of Finland, Finland & Delft Univ. of Technol., Oulu, Finland
  • fYear
    2009
  • fDate
    15-20 Nov. 2009
  • Firstpage
    233
  • Lastpage
    241
  • Abstract
    This paper presents the concept of using behavioral pattern mining to generate models for model-based testing. These patterns are mined from observations captured from execution scenarios of the system under test, and the different patterns are combined in order to provide a suitable higher level model for model-based testing. The concept is first discussed on a general level, providing a basis for implementation of semi-automated model generation algorithms based on combinations of different behavioral patterns. This concept is illustrated by showing how to generate extended finite state machine models in a format suitable for model-based testing. The generated model is further validated by applying it for model-based testing of a real software component, where it reveals actual faults in the system under test. In addition to the benefits, the discovered limitations of the approach are discussed. Future work is discussed as potential means to address these limitations.
  • Keywords
    data mining; finite state machines; program testing; software performance evaluation; behavioral pattern mining; behavioral patterns combination; behaviour pattern based model generation; finite state machine model; model based testing; semi automated model generation algorithm; system under test; Automatic testing; Monitoring; Paper technology; Power generation; Power system modeling; Programming; Runtime; Software testing; System testing; Test pattern generators; behavioral patterns; model generation; model-based testing; pattern mining;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future Computing, Service Computation, Cognitive, Adaptive, Content, Patterns, 2009. COMPUTATIONWORLD '09. Computation World:
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-4244-5166-1
  • Electronic_ISBN
    978-0-7695-3862-4
  • Type

    conf

  • DOI
    10.1109/ComputationWorld.2009.10
  • Filename
    5359589