DocumentCode
2759087
Title
Behaviour Pattern-Based Model Generation for Model-Based Testing
Author
Kanstren, Teemu
Author_Institution
VTT Tech. Res. Centre of Finland, Finland & Delft Univ. of Technol., Oulu, Finland
fYear
2009
fDate
15-20 Nov. 2009
Firstpage
233
Lastpage
241
Abstract
This paper presents the concept of using behavioral pattern mining to generate models for model-based testing. These patterns are mined from observations captured from execution scenarios of the system under test, and the different patterns are combined in order to provide a suitable higher level model for model-based testing. The concept is first discussed on a general level, providing a basis for implementation of semi-automated model generation algorithms based on combinations of different behavioral patterns. This concept is illustrated by showing how to generate extended finite state machine models in a format suitable for model-based testing. The generated model is further validated by applying it for model-based testing of a real software component, where it reveals actual faults in the system under test. In addition to the benefits, the discovered limitations of the approach are discussed. Future work is discussed as potential means to address these limitations.
Keywords
data mining; finite state machines; program testing; software performance evaluation; behavioral pattern mining; behavioral patterns combination; behaviour pattern based model generation; finite state machine model; model based testing; semi automated model generation algorithm; system under test; Automatic testing; Monitoring; Paper technology; Power generation; Power system modeling; Programming; Runtime; Software testing; System testing; Test pattern generators; behavioral patterns; model generation; model-based testing; pattern mining;
fLanguage
English
Publisher
ieee
Conference_Titel
Future Computing, Service Computation, Cognitive, Adaptive, Content, Patterns, 2009. COMPUTATIONWORLD '09. Computation World:
Conference_Location
Athens
Print_ISBN
978-1-4244-5166-1
Electronic_ISBN
978-0-7695-3862-4
Type
conf
DOI
10.1109/ComputationWorld.2009.10
Filename
5359589
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