• DocumentCode
    2759904
  • Title

    Sequential circuit verification using symbolic model checking

  • Author

    Burch, J.R. ; Clarke, E.M. ; McMillan, K.L. ; Dill, David L.

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    1990
  • fDate
    24-28 Jun 1990
  • Firstpage
    46
  • Lastpage
    51
  • Abstract
    The temporal logic model algorithm of E.M. Clarke et al. (ACM Trans. Prog. Lang. Syst., vol.8, no.2, p.244-63, 1986) is modified to represent a state graph using binary decision diagrams (BDDs). Because this representation captures some of the regularity in the state space of sequential circuits with data path logic, one is able to verify circuits with an extremely large number of states. This new technique is demonstrated on a synchronous pipelined design with approximately 5×1020 states. The logic that is used to specify circuits is a propositional temporal logic of branching time, called CTL or Computation Tree Logic. The model checking algorithm handles full CTL with fairness constraints. Consequently. it is possible to handle a number of important liveness and fairness properties. which would otherwise not be expressible in CTL. The method presented is not necessarily a replacement for brute-force state-enumeration methods but an alternative that may work efficiently when the brute force methods fail
  • Keywords
    logic CAD; logic testing; sequential circuits; temporal logic; CTL; Computation Tree Logic; binary decision diagrams; circuit verification; data path logic; fairness constraints; liveness; model checking algorithm; propositional temporal logic of branching time; regularity; sequential circuits; state graph; symbolic model checking; synchronous pipelined design; temporal logic model algorithm; Asynchronous circuits; Boolean functions; Circuit simulation; Circuit testing; Data structures; Hardware; Logic circuits; Logic testing; Sequential circuits; State-space methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1990. Proceedings., 27th ACM/IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    0738-100X
  • Print_ISBN
    0-89791-363-9
  • Type

    conf

  • DOI
    10.1109/DAC.1990.114827
  • Filename
    114827