Test and design considerations for a 4 GHz gated ring oscillator in 65 nm CMOS technology for biomedical UWB applications

Author

Novak, Ondrej ; Young, Darrin J.

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Utah, Salt Lake City, UT, USA

Volume

1

fYear

2010

fDate

20-23 Sept. 2010

Firstpage

1

Lastpage

4

Abstract

This paper describes the practical issues associated with the test and design of an impulse-based ultra wideband (I-UWB) transmitter for biomedical applications. A 4 GHz gated ring oscillator is designed and fabricated in a 65 nm CMOS process as a pulse generator for a pulse-position-modulated I-UWB transmitter. The parasitic effects on-chip and off-chip associated with the test setup are investigated, simulated, and experimentally verified. Modeling of the parasitic effects is developed for an improved accuracy in simulation as well as measurement. Further guidelines for design and packaging are introduced.

Keywords

CMOS integrated circuits; biomedical electronics; oscillators; pulse generators; pulse position modulation; radio transmitters; ultra wideband technology; CMOS process; CMOS technology; biomedical UWB applications; frequency 4 GHz; gated ring oscillator; impulse-based ultra wideband transmitter; parasitic effects off-chip; parasitic effects on-chip; pulse generator; pulse-position-modulated I-UWB transmitter; size 65 nm;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultra-Wideband (ICUWB), 2010 IEEE International Conference on

Conference_Location

Nanjing

Print_ISBN

978-1-4244-5305-4

Electronic_ISBN

978-1-4244-5306-1

Type

conf

DOI

10.1109/ICUWB.2010.5615750

Filename

5615750