DocumentCode
2760188
Title
Low power self-checking two-rail code checker design
Author
Shieh, Shao-Hui
Author_Institution
Dept. of Electron. Eng., Nat. Chin-Yi Univ. of Technol., Taichung, Taiwan
fYear
2011
fDate
19-20 July 2011
Firstpage
191
Lastpage
194
Abstract
Totally self-checking (TSC) system can execute on-line testing in normal operation mode and immediately detect the fault existing in a system to enhance reliability. In this paper, a novel non-tree structure two-rail code self-checking checker (denoted by TCC-P) is proposed. Based on TSMC 0.18um process technology, the real chip is designed and verified. The experiment results show that the proposed checker has reduced 39.30% power dissipation with the penalty of little area overhead as compared with the best one previous work. The feature of both lower power and the capability to work in both clock phases confirm our design is valid and efficient.
Keywords
CMOS integrated circuits; integrated circuit reliability; integrated circuit testing; TCC-P; TSMC; low power self-checking system; online testing; reliability; two-rail code checker design; Circuit faults; Totally self-checking; checker; on-line test; two-rail code;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ASQED), 2011 3rd Asia Symposium on
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4577-0145-0
Type
conf
DOI
10.1109/ASQED.2011.6111743
Filename
6111743
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