DocumentCode :
2760397
Title :
Texture classification using wavelet transform and support vector machines
Author :
Sidhu, Samsher ; Raahemifar, Kaamran
Author_Institution :
Dept. of Electr. & Comput. Eng., Ryerson Univ., Toronto, Ont.
fYear :
2005
fDate :
1-4 May 2005
Firstpage :
941
Lastpage :
944
Abstract :
In this paper, we have investigated an approach based on support vector machines (SVMs) and wavelet transform (WT) for texture analysis. Texture analysis plays an important role in many tasks, ranging from remote sensing to medical imaging and query by content in large image databases. The main difficulty of texture analysis in the past was the lack of adequate tools to characterize different scales of texture effectively. The development in multi-resolution analysis such as wavelet transform has helped overcome this difficulty. It was found that the results using the combination of wavelet statistical and wavelet co-occurrence features generated from discrete wavelet transform for texture classification are promising. In recent years, support vector machines (SVM) have demonstrated excellent performance in a variety of pattern recognition problems. By applying SVM in tandem with the discrete wavelet transform for texture classification, it has produced more accurate classification results based on the Brodatz texture database
Keywords :
discrete wavelet transforms; image classification; image resolution; image texture; statistical analysis; support vector machines; visual databases; Brodatz texture database; SVM; discrete wavelet transform; image databases; medical imaging; multiresolution analysis; pattern recognition problems; remote sensing; support vector machines; texture analysis; texture classification; wavelet cooccurrence features; wavelet transform; Biomedical imaging; Discrete wavelet transforms; Image analysis; Image databases; Image texture analysis; Remote sensing; Support vector machine classification; Support vector machines; Wavelet analysis; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering, 2005. Canadian Conference on
Conference_Location :
Saskatoon, Sask.
ISSN :
0840-7789
Print_ISBN :
0-7803-8885-2
Type :
conf
DOI :
10.1109/CCECE.2005.1557131
Filename :
1557131
Link To Document :
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