DocumentCode :
2760596
Title :
Extension of inverse WKB method for refractive-index profiling of single-mode graded-index planar waveguides
Author :
Chiang, K.S. ; Wong, C.L. ; Cheng, S.Y. ; Chan, H.P.
Author_Institution :
Optoelectron. Res. Centre & Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
776
Abstract :
It is of fundamental importance to determine the refractive-index profile of a graded-index planar waveguide, as the profile can give useful information about the waveguide fabrication process and the transmission characteristics of the waveguide. The most popular method for refractive-index profiling of planar waveguides appears is the inverse WKB method. In this paper, we propose a technique of combining effective indices measured with different external refractive indices. The technique is simple to implement and allows accurate profiling of single-mode waveguides at a fixed wavelength
Keywords :
WKB calculations; gradient index optics; optical planar waveguides; optical waveguide theory; refractive index; inverse WKB method; refractive index profiling; single-mode graded-index planar waveguide; Dispersion; Liquids; Optimized production technology; Propagation constant; Turning; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location :
Rio Grande
ISSN :
1092-8081
Print_ISBN :
0-7803-5947-X
Type :
conf
DOI :
10.1109/LEOS.2000.894084
Filename :
894084
Link To Document :
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