DocumentCode :
2760692
Title :
Study on the variation in thermal resistance and junction temperature of GaN based LEDs using thermal transient measurement
Author :
Teeba, N. ; Yew, L. Kean ; Keng, L. Chin ; Anithambigai, P. ; Dinash, K. ; Mutharasu, D.
Author_Institution :
Sch. of Phys., Univ. Sains Malaysia (USM), Minden, Malaysia
fYear :
2011
fDate :
19-20 July 2011
Firstpage :
310
Lastpage :
314
Abstract :
Proper heat management in solid state lighting (SSL) is vital to enhance its efficiency and reliability. The ease of heat flow through the LED package was described in terms of the thermal resistance, Rth. In this study white and green LEDs were used to investigate the variation in junction temperature and junction-to-ambient thermal resistance, RthJA. It was reported that the green LED always shows higher junction temperature and thermal resistance compared to the white LED. This is due to current crowding effect at the p-n junction of the green LED. At 700mA, the RthJA of green LED was increased about 3KW compare with white LED. Furthermore, the die attach quality also influences the temperature rise and thermal resistance of the LED packages. Due to poor die attach, the RthJA rises about 7K/W when compared with good die attach sample.
Keywords :
III-V semiconductors; gallium compounds; light emitting diodes; p-n junctions; thermal resistance; wide band gap semiconductors; GaN; GaN based LED; LED package; current 700 mA; die attach quality; heat flow; heat management; junction temperature; junction-to-ambient thermal resistance; p-n junction; solid state lighting; temperature rise; thermal transient measurement; Electronic packaging thermal management; Heating; Junctions; Light emitting diodes; Temperature measurement; Thermal resistance; Structure function; Thermal transient measurement; junction temperature; junction-to-ambient thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ASQED), 2011 3rd Asia Symposium on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4577-0145-0
Type :
conf
DOI :
10.1109/ASQED.2011.6111766
Filename :
6111766
Link To Document :
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