Title :
Characterization of Nano-Crystalline Nickel Supported Zirconia and its Catalytic Activity of Hydrogenation of Nitrophenol
Author :
Mallick, Sujata ; Rana, Surjyakanta ; Parida, K.M.
Author_Institution :
Colloids & Mater. Chem. Dept., Inst. of Miner. & Mater. Technol., Bhubaneswar, India
Abstract :
Mesoporous zirconia was prepared by the surfactant assisted route, using cetyltrimethylammonium bromide as cationic surfactant. The synthesized zirconia was employed as support for nickel catalysts in reduction reaction of nitrophenol at room temperature. The catalysts were characterized by nitrogen adsorption-desorption, X-ray powder diffraction, Fourier-transfer infrared spectroscopy (FTIR), Transmittance electron micrograph (TEM), UV-Vis diffuse reflectance spectroscopy (UV-Vis DRS), temperature programmed reduction (TPR) and X-ray photoelectron spectroscopy (XPS). The nitrogen adsorption-desorption studies revealed that the modified samples retain the mesoporosity.
Keywords :
Fourier transform spectra; X-ray diffraction; X-ray photoelectron spectra; adsorption; catalysis; desorption; hydrogenation; infrared spectra; mesoporous materials; nanofabrication; nanostructured materials; nickel; reduction (chemical); surfactants; transmission electron microscopy; ultraviolet spectra; visible spectra; zirconium compounds; FTIR spectroscopy; Fourier-transfer infrared spectroscopy; Ni-ZrO2; TEM; UV-Vis DRS; UV-vis diffuse reflectance spectroscopy; X-ray photoelectron spectroscopy; X-ray powder diffraction; XPS; adsorption-desorption; catalytic activity; cationic surfactant; cetyltrimethylammonium bromide; hydrogenation; nanocrystalline mesoporous nickel supported zirconia; nitrophenol; reduction; temperature 293 K to 298 K; temperature programmed reduction; transmittance electron micrography; Mesoporous materials; Nickel; Nitrogen; Surface treatment; X-ray scattering; Zirconium;
Conference_Titel :
Nanoscience, Technology and Societal Implications (NSTSI), 2011 International Conference on
Conference_Location :
Bhubaneswar
Print_ISBN :
978-1-4577-2035-2
DOI :
10.1109/NSTSI.2011.6111782
