DocumentCode :
2761192
Title :
Microwave Assisted Sintering of Some Copper Based Nano-Composites and its Evaluation
Author :
Sahani, Pankajini ; Mula, Suhrit ; Mohanty, UK
Author_Institution :
Dept. of Metall. & Mater. Enineering, Nat. Inst. of Technol., Rourkela, India
fYear :
2011
fDate :
8-10 Dec. 2011
Firstpage :
1
Lastpage :
6
Abstract :
In the present investigation Cu99Cr1, Cu94Cr6, Cu99Cr1-4% SiC and Cu94Cr6-4% SiC nanocomposites were synthesized for thermo-electric applications. SiC particulates (purity >;96.0%, ~30 nm size) was ball milled with copper-chromium (purity >;99.0 %) mixtures for 50 h in stainless steel grinding media. The uniaxially pressed compact specimens were subjected to microwave sintering 900°C, 30 min and conventional sintering 900°C, 1 h. The microstructural characterization was carried out by X-ray diffraction, scanning electron microscopy and atomic force microscopy. The mechanical properties like Vickers hardness and wear resistance, and electrical conductivity of the sintered specimens were also investigated. In the present investigation, the best combination of mechanical properties and electrical conductivity were obtained for the microwave sintered specimens compared to conventional sintered compacts. This is possibly due to the enhanced densification achieved through microwave sintering technique.
Keywords :
Vickers hardness; X-ray diffraction; atomic force microscopy; chromium alloys; copper alloys; densification; electrical conductivity; nanocomposites; nanofabrication; scanning electron microscopy; silicon compounds; sintering; wear resistance; Cu94Cr6; Cu94Cr6-SiC; Cu99Cr; Cu99Cr-SiC; Vickers hardness; X-ray diffraction; atomic force microscopy; copper based nanocomposites; densification; electrical conductivity; mechanical properties; microstructural property; microwave assisted sintering; scanning electron microscopy; temperature 900 degC; time 30 min; time 50 h; wear resistance; Conductivity; Copper; Mechanical factors; Microwave measurements; Microwave theory and techniques; Resistance; Silicon carbide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoscience, Technology and Societal Implications (NSTSI), 2011 International Conference on
Conference_Location :
Bhubaneswar
Print_ISBN :
978-1-4577-2035-2
Type :
conf
DOI :
10.1109/NSTSI.2011.6111798
Filename :
6111798
Link To Document :
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