Title :
Error Control to Increase the Yield of Semiconductor RAM´s
Author :
Krishnamoorthy, Rajeev ; Heegard, Chris
Author_Institution :
Cornell University
Keywords :
Decoding; Error correction; Error correction codes; Random access memory; Read-write memory; Redundancy; Semiconductor device manufacture; Switches;
Conference_Titel :
Information Theory Workshop at Cornell, The 1989 IEEE/CAM
DOI :
10.1109/ITW.1989.761432
