• DocumentCode
    2761392
  • Title

    Prospective and issues for GaN microwave electronics into space satellites

  • Author

    Cazaux, Jean-Louis ; Forestier, Stéphane ; Villemazet, Jean-François ; Vendier, Olivier ; Schaffauser, Chloé ; Drevon, Claude ; Muraro, Jean-Luc

  • Author_Institution
    Alcatel Alenia Space-France, Toulouse
  • fYear
    2006
  • fDate
    12-15 Dec. 2006
  • Firstpage
    1023
  • Lastpage
    1026
  • Abstract
    On the very last months, gallium nitride (GaN) technology has made a remarked breakthrough in the world of microwave electronics with the announcement of commercially available power transistors. Those striking news follow several publicized results that had been published since few years. How this GaN technology would impact space- borne units is now a priority concern. Although the power capability of GaN technology is the first obvious profit, GaN could also be used for other applications like low noise amplifiers, mixers and probably more. The high sustainable temperature of GaN transistors is most striking advantage for in-flight use. This is connected to packaging design which is also experiencing a lot of activities and quick progresses. Of course, space application is dependent upon the full demonstration of reliability and this constitutes another field of investigation. Finally, our very first, promising, experimental results are presented: they open wide the road a revolution inside space-borne electronics: the rise of GaN.
  • Keywords
    artificial satellites; gallium compounds; microwave devices; power transistors; GaN technology; microwave electronics; power transistors; space satellites; Electronics packaging; Gallium nitride; IEEE news; III-V semiconductor materials; Low-noise amplifiers; Microwave technology; Power transistors; Satellites; Space technology; Temperature; Gallium Nitride; power amplifiers; satellite equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2006. APMC 2006. Asia-Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-4-902339-08-6
  • Electronic_ISBN
    978-4-902339-11-6
  • Type

    conf

  • DOI
    10.1109/APMC.2006.4429584
  • Filename
    4429584