Title :
Recent progress of high power GaN-HEMT for wireless application
Author :
Joshin, Kazukiyo ; Kikkawa, Toshihide
Author_Institution :
Fujitsu Lab. Ltd., Atsugi
Abstract :
In this paper, we describe the recent progress of high power GaN high electron mobility transistors (GaN HEMTs) for wireless base station application. First we introduce device technology and RF power performance of GaN HEMTs. Next, we discuss their reliability and cost issues which are great important for practical applications. As an example, GaN HEMTs on a low-cost conductive 3-inch SiC substrate are discussed. In addition, next generation wireless base station system will require extremely high efficiency power amplifiers when GaN HEMTs will be used at near saturation region. To suppress a forward gate leakage current at the saturation region, we developed a metal-insulator-semiconductor (MIS) gate GaN HEMT with an output power of over 100 W.
Keywords :
MIS devices; high electron mobility transistors; integrated circuit reliability; radiocommunication; SiC substrate; forward gate leakage current; high electron mobility transistors; high power GaN-HEMT; metal-insulator-semiconductor; near saturation region; next generation wireless base station system; wireless base station application; Base stations; Costs; Gallium nitride; HEMTs; High power amplifiers; MODFETs; Power system reliability; Radio frequency; Radiofrequency amplifiers; Silicon carbide; GaN; HEMT; Power amplifier; Transistor; Wireless;
Conference_Titel :
Microwave Conference, 2006. APMC 2006. Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-4-902339-08-6
Electronic_ISBN :
978-4-902339-11-6
DOI :
10.1109/APMC.2006.4429585