• DocumentCode
    2761409
  • Title

    Recent progress of high power GaN-HEMT for wireless application

  • Author

    Joshin, Kazukiyo ; Kikkawa, Toshihide

  • Author_Institution
    Fujitsu Lab. Ltd., Atsugi
  • fYear
    2006
  • fDate
    12-15 Dec. 2006
  • Firstpage
    1027
  • Lastpage
    1032
  • Abstract
    In this paper, we describe the recent progress of high power GaN high electron mobility transistors (GaN HEMTs) for wireless base station application. First we introduce device technology and RF power performance of GaN HEMTs. Next, we discuss their reliability and cost issues which are great important for practical applications. As an example, GaN HEMTs on a low-cost conductive 3-inch SiC substrate are discussed. In addition, next generation wireless base station system will require extremely high efficiency power amplifiers when GaN HEMTs will be used at near saturation region. To suppress a forward gate leakage current at the saturation region, we developed a metal-insulator-semiconductor (MIS) gate GaN HEMT with an output power of over 100 W.
  • Keywords
    MIS devices; high electron mobility transistors; integrated circuit reliability; radiocommunication; SiC substrate; forward gate leakage current; high electron mobility transistors; high power GaN-HEMT; metal-insulator-semiconductor; near saturation region; next generation wireless base station system; wireless base station application; Base stations; Costs; Gallium nitride; HEMTs; High power amplifiers; MODFETs; Power system reliability; Radio frequency; Radiofrequency amplifiers; Silicon carbide; GaN; HEMT; Power amplifier; Transistor; Wireless;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2006. APMC 2006. Asia-Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-4-902339-08-6
  • Electronic_ISBN
    978-4-902339-11-6
  • Type

    conf

  • DOI
    10.1109/APMC.2006.4429585
  • Filename
    4429585