• DocumentCode
    2761471
  • Title

    Effect of heterobarrier leakage on the performance of high power 1.5-μm InGaAsP multiple quantum well lasers

  • Author

    Belenky, C. ; Shterengas, L. ; Trussel, W. ; Menna, R. ; Donetsky, D. ; Connolly, J. ; Garbuzov, D.

  • Author_Institution
    State Univ. of New York, Stony Brook, NY, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    872
  • Abstract
    Eye-safe semiconductor lasers are in demand for development of laser range finder and countermeasure systems. These applications require high level of pulsed optical power. We carried out a comprehensive study of the nature of power saturation in 1.5-μm high power InGaAsP/InP multiple quantum well two step graded SCH lasers. We calculated the internal efficiency normalized to its threshold value for narrow waveguide devices from both the experimental L-I curves and the simulation results. The modeling explains qualitatively all experimental observations. The quantitative discrepancy can be understood taking into account two factors: device overheating even for short pulse operation at high current densities and the increase of the internal loss with current above threshold
  • Keywords
    III-V semiconductors; gallium arsenide; gradient index optics; indium compounds; laser modes; leakage currents; optical losses; quantum well lasers; waveguide lasers; 1.5 micron; InGaAsP-InP; device overheating; eyesafe semiconductor lasers; heterobarrier leakage effect; high current densities; high power MQW lasers; internal efficiency; internal loss increase; laser performance; narrow waveguide devices; power saturation; short pulse operation; spontaneous emission; threshold value; two step graded SCH lasers; Current density; Indium phosphide; Laser modes; Optical pulses; Optical saturation; Optical waveguides; Power lasers; Quantum well lasers; Semiconductor lasers; Waveguide lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
  • Conference_Location
    Rio Grande
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-5947-X
  • Type

    conf

  • DOI
    10.1109/LEOS.2000.894132
  • Filename
    894132