• DocumentCode
    2761573
  • Title

    Supporting Concern-Based Regression Testing and Prioritization in a Model-Driven Environment

  • Author

    Filho, Roberto S Silva ; Budnik, Christof J. ; Hasling, William M. ; McKenna, Monica ; Subramanyan, Rajesh

  • Author_Institution
    Software Eng. Dept., Siemens Corp. Res., Princeton, NJ, USA
  • fYear
    2010
  • fDate
    19-23 July 2010
  • Firstpage
    323
  • Lastpage
    328
  • Abstract
    Traditional regression testing and prioritization approaches are bottom-up (or white-box). They rely on the analysis of the impact of changes in source code artifacts, identifying corresponding parts of software to retest. While effective in minimizing the amount of testing required to validate code changes, they do not leverage on specification-level design and requirements concerns that motivated these changes. Model-based testing approaches support a top-down (or black box) testing approach, where design and requirements models are used in support of test generation. They augment code-based approaches with the ability to test from a higher-level design and requirements perspective. In this paper, we present a model-based regression testing and prioritization approach that efficiently selects test cases for regression testing based on different concerns. It relies on traceability links between models, test cases and code artifacts, together with user-defined properties associated to model elements. In particular we describe how to support concern-based regression testing and prioritization using TDE/UML, an extensible model-based testing environment.
  • Keywords
    program testing; regression analysis; UML; code based approaches; model based testing approaches; model driven environment; source code artifacts; specification level design; supporting concern based regression testing; user defined properties; Model-driven testing; regression testing; test development; test prioritization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Software and Applications Conference Workshops (COMPSACW), 2010 IEEE 34th Annual
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-8089-0
  • Electronic_ISBN
    978-0-7695-4105-1
  • Type

    conf

  • DOI
    10.1109/COMPSACW.2010.63
  • Filename
    5615818