Bridging the gap between embedded test and ATE

Author

Bell, Martin ; Danialy, Givargis ; Howells, Michael ; Pateras, Stephen

Author_Institution

LogicVision Inc., San Jose, CA, USA

fYear

2000

fDate

2000

Firstpage

55

Lastpage

63

Abstract

This paper presents a methodology and software system architecture that enable conventional test equipment to take full advantage of embedded test structures implemented within the device under test. The proposed methodology provides a seamless transfer of embedded test related information from the design engineering to the manufacturing test environment, allowing for automated control of the embedded test for production go/no-go testing as well as advanced failure diagnosis

Keywords

application program interfaces; automatic test equipment; automatic test pattern generation; automatic test software; built-in self test; design for testability; embedded systems; production testing; software architecture; API; ATE; BIST; IP generator; advanced failure diagnosis; automated control; design engineering environment; embedded test access software; embedded test structures; manufacturing test environment; production go/no-go testing; seamless transfer; software integration; software system architecture; test methodology; Automatic control; Automatic testing; Computer architecture; Design engineering; Manufacturing automation; Production; Software systems; Software testing; System testing; Test equipment;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2000. Proceedings. International

Conference_Location

Atlantic City, NJ

ISSN

1089-3539

Print_ISBN

0-7803-6546-1

Type

conf

DOI

10.1109/TEST.2000.894191

Filename

894191