DocumentCode
2761821
Title
Doing it in STIL: intelligent conversion from STIL to an ATE format
Author
Parnas, Bruce R.
Author_Institution
Advantest America R&D Center, Santa Clara, CA, USA
fYear
2000
fDate
2000
Firstpage
64
Lastpage
71
Abstract
The STIL test language has recently become a standard. Most test systems do not use STIL as a native language, however. There is a requirement for conversion from STIL to a tester´s native language. This paper presents a methodology for intelligent and efficient conversion from STIL to a cycle-based tester format
Keywords
automatic test equipment; automatic test pattern generation; automatic test software; boundary scan testing; high level languages; ATE format; ATPG; STIL test language; cycle-based tester format; efficient conversion; event-based intermediate format; intelligent conversion; output signal conversion; scan test; table-based analysis; template matching; Automatic test pattern generation; Benchmark testing; Data analysis; Optical signal processing; Prototypes; Runtime; System testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2000. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-6546-1
Type
conf
DOI
10.1109/TEST.2000.894192
Filename
894192
Link To Document