• DocumentCode
    2761842
  • Title

    Surface micrometrology using ultrasound

  • Author

    Blessing, G.V. ; Eitzen, D.G. ; Ryan, H.M. ; Slotwinski, J.A.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    1990
  • fDate
    4-7 Dec 1990
  • Firstpage
    1047
  • Abstract
    The development of ultrasonic scattering and reflection techniques for the online measurement of machined part surface features is described. A range of ultrasonic frequencies and beam dimensions was supplied to shaped and turned sample surfaces, using both scattering and profiling techniques. It is demonstrated that it is feasible for pulsed ultrasound to resolve average roughness values and discrete asperities of less than 1 μm
  • Keywords
    surface topography measurement; ultrasonic materials testing; average roughness values; beam dimensions; discrete asperities; machined part surface features; online measurement; profiling techniques; pulsed ultrasound; shaped sample surfaces; surface micrometrology; turned sample surfaces; ultrasonic frequencies; ultrasonic reflection techniques; ultrasonic scattering; Frequency; Manufacturing; Monitoring; Optical reflection; Pulse measurements; Rough surfaces; Scattering; Surface roughness; Surface topography; Ultrasonic imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1990. Proceedings., IEEE 1990
  • Conference_Location
    Honolulu, HI
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1990.171522
  • Filename
    171522