• DocumentCode
    2761937
  • Title

    Development of non-contact handling system for semiconductor wafers

  • Author

    Tokisue, Hiromitsu ; Matsuoka, Kazuhiko

  • Author_Institution
    Hitachi Ltd., Yokohama, Japan
  • fYear
    1989
  • fDate
    26-28 Apr 1989
  • Firstpage
    246
  • Lastpage
    249
  • Abstract
    A wafer-handling device that keeps wafers clean during wafer handling in semiconductor (i.e. VLSI) production processes has been developed. Through the mutual action of air suction and blowout, the device raises, reverses, and transports wafers without making contact while maintaining a gap of 0.3 mm between the wafer and the handler. As the wafer is held without any contact, particle addition through contact or contaminants generated by shock are prevented. As a strong supporting force is applied, large and heavy wafers can also be easily handled. After using this device with atmospheric pressure CVD (chemical vapor deposition) equipment for transporting and transferring wafers, results showed that the number of particles added to wafers was reduced to 1/2-1/4 compared to results achieved with the latest conventional equipment. This wafer handler shows its strength in maintaining high cleanliness levels for semiconductor production processes and makes a major contribution to increasing efficiency and upgrading quality
  • Keywords
    VLSI; chemical vapour deposition; integrated circuit manufacture; materials handling; process computer control; VLSI; air suction; atmospheric pressure CVD; blowout; cleanliness levels; efficiency; noncontact handling; particle addition; quality; semiconductor production processes; semiconductor wafers; supporting force; wafer-handling device; Circuits; Electric shock; Laboratories; Mechanical engineering; Production; Productivity; Semiconductor devices; Surface cleaning; Very large scale integration; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International
  • Conference_Location
    Nara
  • Type

    conf

  • DOI
    10.1109/IEMTS.1989.76148
  • Filename
    76148