DocumentCode
2762214
Title
Deterministic partitioning techniques for fault diagnosis in scan-based BIST
Author
Bayraktaroglu, Ismet ; Orailo, Alex
Author_Institution
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
fYear
2000
fDate
2000
Firstpage
273
Lastpage
282
Abstract
A deterministic partitioning technique for fault diagnosis in scan-based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified and low cost hardware implementations of high quality deterministic partitions are outlined. The superiority of the partitions generated by the proposed approach is confirmed through mathematical analysis. Theoretical analyses, worst case bounds, and experimental simulation data all confirm the superiority of the proposed deterministic approaches
Keywords
built-in self test; design for testability; fault diagnosis; logic partitioning; logic testing; deterministic partitioning technique; diagnosis times; experimental simulation data; fault diagnosis; high quality deterministic partitions; low cost hardware implementations; scan-based BIST; worst case bounds; Analytical models; Automatic testing; Built-in self-test; Computer science; Costs; Data mining; Fault diagnosis; Hardware; Mathematical analysis; Polynomials;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2000. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-6546-1
Type
conf
DOI
10.1109/TEST.2000.894215
Filename
894215
Link To Document