DocumentCode
2762440
Title
The single event effects performance of low power embedded fixed point digital signal processors and microprocessor
Author
Hiemstra, David M. ; Deschenes, David ; Hill, Darren
Author_Institution
MDA, BC
fYear
2005
fDate
1-4 May 2005
Firstpage
1457
Lastpage
1460
Abstract
In this paper, the approach followed to characterize the single event upset susceptibility of the analog devices Blackfin BF533 and Texas Instruments TMS320VC5510 embedded digital signal processors; and the Freescale Semiconductor Coldfire M5249C3 embedded microprocessor using high energy protons, is presented. Single event latchup and total dose effects are also discussed
Keywords
digital signal processing chips; low-power electronics; Blackfin BF533; Freescale Semiconductor Coldfire; M5249C3; TMS320VC5510; Texas Instruments; analog devices; high energy protons; low power embedded fixed point digital signal processors; microprocessor; single event effects; single event upset susceptibility; Atmosphere; Digital signal processors; Instruments; Mars; Memory management; Microprocessors; Performance evaluation; Protons; Single event upset; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering, 2005. Canadian Conference on
Conference_Location
Saskatoon, Sask.
ISSN
0840-7789
Print_ISBN
0-7803-8885-2
Type
conf
DOI
10.1109/CCECE.2005.1557254
Filename
1557254
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