Title :
Pattern generation tools for the development of memory core test patterns for Rambus devices
Author :
Privitera, John ; Woo, Steven ; Soldat, Craig
Author_Institution :
Rambus Inc., USA
Abstract :
This paper presents tools that were used in the development of test patterns for Rambus memory devices, Three tools are presented in this paper, Radical, the RL pre-processor, and Rad2MTL. RL and Rad2MTL exploit the capabilities of an executable software model for Rambus DRAMs (Radical) to allow a user to create patterns in a language that supports packet-based protocols and translate the pattern to the Algorithmic Pattern Generator language (MTL) of a memory tester
Keywords :
automatic test pattern generation; integrated circuit testing; integrated memory circuits; logic testing; memory protocols; software tools; ATPG; Algorithmic Pattern Generator language; DRAMs; RL pre-processor tool; Rad2MTL tool; Radical tool; Rambus devices; executable software model; memory core test patterns; packet-based protocols; pattern generation tools; Bandwidth; Circuit testing; Logic devices; Logic testing; Process design; Protocols; Random access memory; Software performance; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894236
