• DocumentCode
    2762533
  • Title

    A subthreshold current model for short channel InP MESFETs

  • Author

    Badr, Khamis H. ; El-Banna, M.

  • Author_Institution
    Air Defense Coll., Alexandria, Egypt
  • Volume
    2
  • fYear
    1994
  • fDate
    3-5 Aug 1994
  • Firstpage
    1273
  • Abstract
    Modeling the subthreshold current of MESFETs becomes very important to VLSI designers. An analytical two-dimensional model for the subthreshold current in InP MESFETs is presented. The model takes into account the short-channel effects on the barrier between the source and the drain, which may cause the device to conduct while it is believed to be cut-off. Obtained results are compared to those published for similar GaAs MESFETs. Comments and discussions are provided
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; electric current; indium compounds; semiconductor device models; InP; VLSI design; analytical 2D model; short channel MESFETs; subthreshold current model; two-dimensional model; Analytical models; Design engineering; Educational institutions; Electrostatics; Gallium arsenide; Indium phosphide; MESFETs; Poisson equations; Subthreshold current; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on
  • Conference_Location
    Lafayette, LA
  • Print_ISBN
    0-7803-2428-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1994.519041
  • Filename
    519041