• DocumentCode
    2762892
  • Title

    Measurement of longitudinal wave properties of low velocity materials using the acoustic microscope

  • Author

    Chan, K.H. ; Bertoni, H.L.

  • Author_Institution
    Dept. of Electr. Eng., Polytech. Univ., New York, NY, USA
  • fYear
    1990
  • fDate
    4-7 Dec 1990
  • Firstpage
    1333
  • Abstract
    In order to measure lateral wave properties for materials having low acoustic velocities, such as polymers, a ray analysis of the excitation, propagation, and subsequent detection of the longitudinal lateral waves was performed. Measurements of the output voltage V with defocus distance z were made using a 50-MHz microscope for several polymeric materials. Ordinary processing of V (z) was used to extract the longitudinal wave velocity for these materials. A least-squares fit of the theoretical to the measured V(z), over the range of validity of the lateral wave expression, was used to find the longitudinal wave attenuation constant
  • Keywords
    acoustic microscopy; acoustic wave absorption; acoustic wave velocity; least squares approximations; polymers; 50 MHz; acoustic microscope; attenuation constant; black nylon 6/6 substrate; defocus distance; least-squares fit; longitudinal lateral waves; low acoustic velocities; polymers; polystyrene styron 615 substrate; ray analysis; Acoustic materials; Acoustic measurements; Acoustic propagation; Acoustic signal detection; Acoustic waves; Performance analysis; Performance evaluation; Polymers; Velocity measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1990. Proceedings., IEEE 1990
  • Conference_Location
    Honolulu, HI
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1990.171580
  • Filename
    171580