• DocumentCode
    2763032
  • Title

    Holographic pattern testing of printed circuit board (PCB) deformation due to thermal stress

  • Author

    Taniguchi, Masanari ; Takagi, Tasuku

  • Author_Institution
    Fac. of Sci. & Technol., Meijo Univ., Nagoya, Japan
  • fYear
    1989
  • fDate
    26-28 Apr 1989
  • Firstpage
    272
  • Lastpage
    275
  • Abstract
    A holographic pattern measuring system (HPMS) is used to measure the deformation of a PCB (printed circuit board) due to thermal stress. A quantitative displacement of the PCB surface can be measured by analyzing the holographic pattern. The HPMS combines holography and graphic image processing. The distribution of the microscopic displacement of the PCB surface due to thermal stress can be visualized, and a 3-D graphic image of the deformation can be obtained automatically. Experiments were carried out to the temperature on the PCB surface, the fringe pattern, and the relationship between the deformation and with the width of copper foil on the PCB through which the current flows
  • Keywords
    holography; printed circuit testing; thermal stresses; 3-D graphic image; PCB surface; copper foil; deformation; fringe pattern; graphic image processing; holographic pattern measuring system; microscopic displacement; printed circuit board; thermal stress; Circuit testing; Displacement measurement; Graphics; Holography; Image processing; Microscopy; Pattern analysis; Printed circuits; Stress measurement; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International
  • Conference_Location
    Nara
  • Type

    conf

  • DOI
    10.1109/IEMTS.1989.76155
  • Filename
    76155