DocumentCode :
2763150
Title :
It isn´t just testing anymore (REDUX)
Author :
Scheiber, Stephen F.
Author_Institution :
ConsuLogic Consulting Services, Slingerlands, NY, USA
fYear :
2000
fDate :
2000
Firstpage :
718
Lastpage :
723
Abstract :
For decades, test professionals touted the virtues first of design for testability and later concurrent engineering. Unfortunately, product complexity and the limitations of traditional test have reduced the effectiveness of such proactive techniques and forced us to look again at what remains within what we still call “test”. To cope with today´s challenges, test strategies must now consider taking advantage of self-tests, incorporating various forms of inspection, and minimizing overlap between test steps
Keywords :
inspection; integrated circuit testing; printed circuit testing; production testing; AOI; automatic optical inspection; inspection techniques; post reflow inspection; post-paste inspection; post-placement inspection; self-tests; test strategies; Automatic testing; Built-in self-test; Concurrent engineering; Costs; Design for testability; Inspection; Manufacturing; Marine vehicles; Nails; Production;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
ISSN :
1089-3539
Print_ISBN :
0-7803-6546-1
Type :
conf
DOI :
10.1109/TEST.2000.894267
Filename :
894267
Link To Document :
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